A Novel SEU Self-Test Structure of SRAM-Based Embryonic Electronic Cell

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Abstract: SRAM-based embryonic electronic cell is susceptible to SEU (Single-Event Upset) in radiation space, which severely restricts its application on deep space. Based on the classic cell structure, delay comparison and dual-mode comparison are respectively used in configurable storage module and logic function module to design a novel embryonic electronic cell. The proposed method can effectively detect 1-bit and multi-bit SEUs in both configuration storage module and logic function module in real time. In addition, by using column elimination, the embryonic electronic cell array can achieve real-time self-repair in case of a fault and keep embryonic electronic array system working normally. Results of simulations in a 4-bit ripple carry adder verify the self-test ability of the embryonic electronic cell and self-repair ability of the embryonic electronic cell array.

WSEAS Transactions on Circuits and Systems, ISSN / E-ISSN: 1109-2734 / 2224-266X, Volume 14, 2015, Art. #40

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Li Danyang, Cai Jinyan, Zhu Sai, Meng Yafeng, "A Novel SEU Self-Test Structure of SRAM-Based Embryonic Electronic Cell," WSEAS Transactions on Circuits and Systems, vol. 14, pp. 347-355, 2015, DOI:
Li Danyang, Cai Jinyan, Zhu Sai, Meng Yafeng. A Novel SEU Self-Test Structure of SRAM-Based Embryonic Electronic Cell. WSEAS Transactions on Circuits and Systems. 2015;14:347-355.
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