WSEAS Transactions on Electronics
Print ISSN: 1109-9445, E-ISSN: 2415-1513
Volume 7, 2016
Let us be Prepared in Defence Against Counterfeit Integrated Circuits
Authors: Neumann Petr, Houser Josef, Navratil Milan, Kresalek Vojtech, Adamek Milan
Abstract: This paper deals with an important topic aimed at counterfeit electronic components and their detection. The preventive technical diagnostics methods for counterfeit components revealing before entering the assembly process are mentioned and described. There are discussed both nowadays common analytical methods and also methods containing counterfeit components revealing potential to be evaluated and applied. Some facts which may influence negatively the component evaluation result are also mentioned. Practical methods for semiconductor component genuineness evaluation are discussed and illustrated with examples based on our research activities in relation to cooperation with electronic devices assembly manufacturers. Those methods correspond with our current research laboratory equipment comprising analogue signature analyzer, electronic component oriented X-ray, fiber laser for component package decapsulation, scanning electron microscopy, confocal microscopy, polarization microscopy, Raman spectroscopy and Terahertz spectroscopy. The model case of counterfeit component discovery among spare parts and replaced parts in a company repairing measurement devices is given in the end of this paper.
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Keywords: Counterfeit electronic component, Analogue Signature Analysis, pin print, I-V characteristics, X-ray inspection, delidding, decapsulation, laser ablation, final wet etching
Pages: 48-64
WSEAS Transactions on Electronics, ISSN / E-ISSN: 1109-9445 / 2415-1513, Volume 7, 2016, Art. #8