WSEAS Transactions on Signal Processing
Print ISSN: 1790-5052, E-ISSN: 2224-3488
Volume 12, 2016
Three-Dimensional Measurement Using Multiple Slits with a Random Dot Pattern - Multiple Slits and Camera Calibration -
Authors: ,
Abstract: Computer vision systems have been used to detect three-dimensional shape data of objects. Slit-laser sweeping or several pattern projections are generated during the recording process when using these systems. Generally, since the recording process requires time, it is necessary to temporarily stop the movement of both the measurement target and the measurement device during the recording process. In order to address this problem, we have developed a measurement system that projects multiple slits with random dots. Three-dimensional shape data can be detected by a single shot. In the proposed method, each slit must be identified in order to judge the projection direction. Random dots are projected onto the same area of multiple slits, and the pattern of random dots is used to identify the slit. In the present paper, an effective calibration method for the system and a method by which to separate each slit and dot pattern in the image are introduced.
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Keywords: Calibration, Computer vision, Random dots, Point cloud, Multiple slits, Laser, Three-dimensional
Pages: 192-202
WSEAS Transactions on Signal Processing, ISSN / E-ISSN: 1790-5052 / 2224-3488, Volume 12, 2016, Art. #23