WSEAS Transactions on Circuits and Systems
Print ISSN: 1109-2734, E-ISSN: 2224-266X
Volume 17, 2018
Failure Prediction Models for Accelerated Life Tests
Authors: ,
Abstract: The aim of this paper is to introduce the reliability methods in connection with lifetime determination and to design testing method for the prediction of the life of the micro switches. These products are subjected to complex stressing, for example, humidity, temperature, current load and so on. Therefore, the most important failure prediction methods, acceleration life testing methods with one, two or more variables have been introduced, as these methods are essential and necessary for reliability prediction.