<doi_batch xmlns="http://www.crossref.org/schema/4.4.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" version="4.4.0"><head><doi_batch_id>778f9fc1-6602-424a-b07b-ffebf06afc35</doi_batch_id><timestamp>20220901061526668</timestamp><depositor><depositor_name>wseas:wseas</depositor_name><email_address>mdt@crossref.org</email_address></depositor><registrant>MDT Deposit</registrant></head><body><journal><journal_metadata language="en"><full_title>WSEAS TRANSACTIONS ON CIRCUITS AND SYSTEMS</full_title><issn media_type="electronic">2224-266X</issn><issn media_type="print">1109-2734</issn><archive_locations><archive name="Portico"/></archive_locations><doi_data><doi>10.37394/23201</doi><resource>http://wseas.org/wseas/cms.action?id=2861</resource></doi_data></journal_metadata><journal_issue><publication_date media_type="online"><month>2</month><day>7</day><year>2022</year></publication_date><publication_date media_type="print"><month>2</month><day>7</day><year>2022</year></publication_date><journal_volume><volume>21</volume><doi_data><doi>10.37394/23201.2022.21</doi><resource>https://wseas.com/journals/cas/2022.php</resource></doi_data></journal_volume></journal_issue><journal_article language="en"><titles><title>Circuit Modeling and Simulation of the ESD Generator for Various Tested Equipment According to the IEC 61000-4-2</title></titles><contributors><person_name sequence="first" contributor_role="author"><given_name>Georgios</given_name><surname>Fotis</surname><affiliation>Department of Electrical and Electronics Engineering Educators ASPETE - School of Pedagogical and Technological Education N. Heraklion, 14121, GREECE</affiliation></person_name><person_name sequence="additional" contributor_role="author"><given_name>Vasiliki</given_name><surname>Vita</surname><affiliation>Department of Electrical and Electronics Engineering Educators ASPETE - School of Pedagogical and Technological Education N. Heraklion, 14121, GREECE</affiliation></person_name></contributors><jats:abstract xmlns:jats="http://www.ncbi.nlm.nih.gov/JATS1"><jats:p>The existing IEC Standard for Electrostatic Discharge (ESD) contains a general and simplified circuit for the generator that produces ESD discharges, without entering into details. The present work tries to fill this gap and proposes a circuit which will generate the ESD current in the limits that the current Standard defines. Two circuit models are examined through simulations with SPICE software, with the one to be the most suitable. This circuit model is also examined for various loads that simulate the Equipment under Test (EUT) and useful conclusions derive up to what type and size of equipment can be safely tested by ESD generators so that the test results are reliable.</jats:p></jats:abstract><publication_date media_type="online"><month>9</month><day>1</day><year>2022</year></publication_date><publication_date media_type="print"><month>9</month><day>1</day><year>2022</year></publication_date><pages><first_page>193</first_page><last_page>201</last_page></pages><publisher_item><item_number item_number_type="article_number">22</item_number></publisher_item><ai:program xmlns:ai="http://www.crossref.org/AccessIndicators.xsd" name="AccessIndicators"><ai:free_to_read start_date="2022-09-01"/><ai:license_ref applies_to="am" start_date="2022-09-01">https://wseas.com/journals/cas/2022/a445101-770.pdf</ai:license_ref></ai:program><archive_locations><archive name="Portico"/></archive_locations><doi_data><doi>10.37394/23201.2022.21.22</doi><resource>https://wseas.com/journals/cas/2022/a445101-770.pdf</resource></doi_data><citation_list><citation key="ref0"><unstructured_citation>Wang A., Practical ESD Protection Design, 1st Edition, Wiley-IEEE Press; 2021. </unstructured_citation></citation><citation key="ref1"><doi>10.1016/b978-1-78548-122-2.50001-7</doi><unstructured_citation>Bafleur M.; Caignet F.; Nolhier N., ESD Protection Methodologies: From Component to System, 1st Edition, ISTE Press – Elsevier, 2017. </unstructured_citation></citation><citation key="ref2"><doi>10.3403/02370237u</doi><unstructured_citation>IEC 61000-4-2. Electromagnetic Compatibility (EMC)—Part 4-2: Electrostatic Discharge Immunity Test, ed. 2.0. 2008. Available online: https://webstore.iec.ch/publication/4189. </unstructured_citation></citation><citation key="ref3"><doi>10.1016/s0304-3886(96)00028-9</doi><unstructured_citation>Pommerenke D., Aidam M.., ESD: waveform calculation, field and current of human and simulator ESD, Journal of Electrostatics, Vol. 38, No. 1-2, 1996, pp. 33-51. </unstructured_citation></citation><citation key="ref4"><doi>10.1016/s0304-3886(02)00056-6</doi><unstructured_citation>Bonisch S., Pommerenke D., Kalkner W., Broadband measurement of ESD risetimes to distinguish between different discharge mechanisms, Journal of Electrostatics, Vol. 56, No. 3,October 2002, pp. 363-383. </unstructured_citation></citation><citation key="ref5"><doi>10.1109/emc-b.2017.8260482</doi><unstructured_citation>Oikawa M., Kawamata K., Ishigami S., Minegishi S., Fujiwara O., Measurement of current distribution on electrode surface of spherical electrode caused by micro gap ESD, IEEE 5th International Symposium on Electromagnetic Compatibility, Beijing, China, 2017, pp. 1-4, doi: 10.1109/EMCB.2017.8260482. </unstructured_citation></citation><citation key="ref6"><doi>10.1109/icept.2018.8480420</doi><unstructured_citation>Lin H., Sheng-zong H., You-liang W., Xiao-si L., Qi-zheng, J., Study on Electrostatic Discharge Damage and Defect Damage Failure Analysis Technology for Semiconductor Devices, 19th International Conference on Electronic Packaging Technology (ICEPT), Shanghai, China, 2018. doi: 10.1109/ICEPT.2018.8480420. </unstructured_citation></citation><citation key="ref7"><doi>10.1002/(sici)1520-6424(199710)80:10&lt;49::aid-ecja6&gt;3.0.co;2-l</doi><unstructured_citation>Murota N., Determination of characteristics of the discharge current by the human charge model ESD Simulator, Electronics and Communications in Japan, Part 1, Vol. 80, No. 10, 1997. pp. 49-57. </unstructured_citation></citation><citation key="ref8"><doi>10.1109/temc.2003.810817</doi><unstructured_citation>Wang, K., Pommerenke, D., Chundru, R., Doren, T.V., Drewniak, J.L., Shashindranath. A. Numerical modeling of electrostatic discharge generators, IEEE Transactions on Electromagnetic Compatibility, Vol. 45, No. 2, pp. 258–271. </unstructured_citation></citation><citation key="ref9"><doi>10.1016/s0304-3886(00)00020-6</doi><unstructured_citation>Amoruso V.; Helali M.; Lattarulo F. An improved model of man for ESD applications, Journal of Electrostatics, Vol. 49, o. 3-4, 2000, pp. 225–244. </unstructured_citation></citation><citation key="ref10"><doi>10.1002/eej.10367</doi><unstructured_citation>Fujiwara O., Tanaka H., Yamanaka Y., Equivalent circuit modelling of discharge current injected in contact with an ESD-gun, Electrical Engineering in Japan, Vol. 149, 2004, pp. 8–14. </unstructured_citation></citation><citation key="ref11"><doi>10.1109/ias.2005.1518497</doi><unstructured_citation>Caniggia S., Maradei F., Circuital and numerical modelling of electrostatic discharge generators, In Proceedings of the 14th IAS Annual Meeting, IEEE Industry Applications Conference, Kowloon, Hong Kong, 8 August 2005; pp. 1119–1123. </unstructured_citation></citation><citation key="ref12"><unstructured_citation>Vita V., Fotis G., Ekonomou L., An Optimization Algorithm for the Calculation of the Electrostatic Discharge Current Equations’ Parameters, WSEAS Transactions on Circuits and Systems, Vol. 15, 2016, pp. 224-228. </unstructured_citation></citation><citation key="ref13"><unstructured_citation>Vita V., Fotis G., Ekonomou L., Parameters’ optimisation methods for the electrostatic discharge current equation, International Journal of Energy, Vol. 11, 2017, pp. 1-6. </unstructured_citation></citation><citation key="ref14"><unstructured_citation>Fotis G., Ekonomou L., Parameters’ Optimization of the Electrostatic Discharge Current, International Journal on Power System Optimization, Vol. 3, No 2, July – December 2011, pp. 75-80. </unstructured_citation></citation><citation key="ref15"><doi>10.3390/en3111728</doi><unstructured_citation>Katsivelis P., Fotis G., Gonos I.F., Koussiouris T.G., Stathopoulos I.A., Electrostatic Discharge Current Linear Approach and Circuit Design Method. Energies, Vol. 3, 2010, pp. 1728-1740. </unstructured_citation></citation><citation key="ref16"><doi>10.3390/electronics11121858</doi><unstructured_citation>Fotis G., Vita V., Ekonomou L. Machine Learning Techniques for the Prediction of the Magnetic and Electric Field of Electrostatic Discharges, Electronics. Vol. 11, No. 12, 2022. https://doi.org/10.3390/electronics11121858 </unstructured_citation></citation><citation key="ref17"><doi>10.1049/iet-smt:20060137</doi><unstructured_citation>Fotis G., Ekonomou L., Maris T.I., Liatsis P., Development of an artificial neural network software tool for the assessment of the electromagnetic field radiating by electrostatic discharges, IEE, Proceedings Science, Measurement &amp; Technology, Vol. 1, No 5, pp 261-269, 2007. https://doi.org/10.1049/ietsmt:20060137 </unstructured_citation></citation><citation key="ref18"><doi>10.1016/j.simpat.2007.07.003</doi><unstructured_citation>Ekonomou L., Fotis G., Maris T.I., Liatsis P., Estimation of the electromagnetic field radiating by electrostatic discharges using artificial neural networks. Simulation Modelling Practice and Theory, Vol. 15, No. 9, pp. 1089-1102, 2007. https://doi.org/10.1016/j.simpat.2007.07.003 </unstructured_citation></citation><citation key="ref19"><unstructured_citation>Greenhouse. H. M., Design of planar microelectronics inductors, Transactions IEEE, PHP-10, No.2, 1974, pp. 101-109. </unstructured_citation></citation><citation key="ref20"><unstructured_citation>A. Vladimirescu, The Spice Book, Wiley (1994) </unstructured_citation></citation><citation key="ref21"><doi>10.1109/15.406531</doi><unstructured_citation>Celozzi S., Felixiani M., Time-domain solution of field-excited multiconductor transmission line equation, Transactions IEEE, EMC-37, No3, 1995, pp. 421-432.</unstructured_citation></citation></citation_list></journal_article></journal></body></doi_batch>